IX - References

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Review articles on spot profile analysis

M. Horn.von Hoegen
Growth of semiconductor layers studies by spot profile analysing low energy electron diffraction
Z. Kristallogr. 214:1-75, 1999 [abstract] [download]

Reciprocal space maps

F.-J. Meyer zu Heringdorf, M. Horn-von Hoegen
Reciprocal space mapping by spot profile analizing low energy electron diffraction
Rev. Sci. Instrum. 76(8):085102/1-5, 2005 [download]

Pulse heating

P. Kury, P. Zahl, M. Horn-von Hoegen, C. Voges, H. Frischat, H. Pfnür, M. Henzler
Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperatures
Rev. Sci. Instrum. 75(11):4911-5, 2004 [download]

ELS-LEED

H. Claus, A. Büssenschütt, M. Henzler
Low-energy electron diffraction with energy resolution
Rev. Sci. Instrum. 63(4):2195-9, 1992 [download]

T. Nagao, S. Hasegawa
Construction of an ELS-LEED: an electron energy-loss spectrometer with electrostatic two-dimensional angular scanning
Surf. Interf. Anal. 30: 488-92, 2000 [download]

Cleaning of silicon surfaces

A. Ishizaka and Y. Shiraki
J. Electrochem. Soc. 133:666, 1986

P. E. Thompson, M. E. Twigg, D. J. Godbey, K. D. Hobart und D. S. Simons
Low-temperature cleaning processes for Si molecular beam epitaxy
J. Vac. Sci. Tech. B 11(3):1077-82, 1993 [download]

Conical shaped front and real-space mode

P. Zahl, M. Horn-von Hoegen
Third-generation conical spot profile analyzing low-energy electron diffraction
Rev. Sci. Instrum. 73(8):2958-62, 2002 [download]

Recent workshops on SPA-LEED

SPA-LEED workshop 2008 [link]

SPA-LEED workshop 2009 [link]