IX - References
The original SPA-LEED paper
U. Scheithauer, G. Meyer, M. Henzler
A new LEED instrument for quantitative spot profile analysis
Surf. Sci. 178(1–3): 441-451, 1986 [download]
Classics on LEED
M. G. Lagally, J. A. Martin
Instrumentation for low-energy electron diffraction
Rev. Sci. Instrum. 54: 1273, 1983 [download]
M. A. Van Hove, S. Y. Tong
Surface Crystallography by LEED
Springer Series in Chemical Physics, Vol. 2, Springer, Berlin, 1979
K. Müller, K. Heinz
The Structure of Surfaces
Springer Series in Surface Sciences, Vol. 2, 105, Springer, Berlin, 1985
Spot profile analysis
J. Wollschläger, J. Falta, M. Henzler
Electron diffraction at stepped homogeneous and inhomogeneous surfaces
Appl. Phys. A 50(1): 57-68, 1990 [download]
M. Horn-von Hoegen
Growth of semiconductor layers studies by spot profile analysing low energy electron diffraction
Z. Kristallogr. 214:1-75, 1999 [abstract]
[download]
W. Moritz, G. Chiarotti, P. Chiaradia (eds.)
Physics of Solid Surfaces · 5.4 SPA-LEED
Landolt-Börnstein - Group III Condensed Matter 45A (Springer Materials), 2015
[Springer] [DOI]
Reciprocal space maps
F.-J. Meyer zu Heringdorf, M. Horn-von Hoegen
Reciprocal space mapping by spot profile analizing low energy electron diffraction
Rev. Sci. Instrum. 76(8):085102/1-5, 2005 [download]
F.-J. Meyer zu Heringdorf, K. L. Roos, Ch. Wiethoff, M. Horn-von Hoegen, K. R. Roos
Growth of Ag nanowires on Au-pre-facetted 4 vicinal Si(0 0 1)
Surf. Sci. 602: 1852–7, 2008[download]
Pulse heating
P. Kury, P. Zahl, M. Horn-von Hoegen, C. Voges, H. Frischat, H. Pfnür, M. Henzler
Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperatures
Rev. Sci. Instrum. 75(11):4911-5, 2004 [download]
SPA-RHEED
B. Müller, M. Henzler
SPA-RHEED — A novel method in reflection high-energy electron diffraction with extremely high angular and energy resolution
Rev. sci. Instrum. 66(11): 5232, 1995 [download]
ELS-LEED
H. Claus, A. Büssenschütt, M. Henzler
Low-energy electron diffraction with energy resolution
Rev. Sci. Instrum. 63(4):2195-9, 1992 [download]
T. Nagao, S. Hasegawa
Construction of an ELS-LEED: an electron energy-loss spectrometer with electrostatic two-dimensional angular scanning
Surf. Interf. Anal. 30: 488-92, 2000 [download]
Latest developments
P. Zahl, M. Horn-von Hoegen
Third-generation conical spot profile analyzing low-energy electron diffraction
Rev. Sci. Instrum. 73(8):2958-62, 2002 [download]
Sample preparation
A. Ishizaka and Y. Shiraki
Low Temperature Surface Cleaning of Silicon and Its Application to Silicon MBE
J. Electrochem. Soc. 133:666, 1986 [download]
P. E. Thompson, M. E. Twigg, D. J. Godbey, K. D. Hobart und D. S. Simons
Low-temperature cleaning processes for Si molecular beam epitaxy
J. Vac. Sci. Tech. B 11(3):1077-82, 1993 [download]